Analytical and Materials Characterization

The Analytical and Materials Characterization Core Technology Platform aids in the investigation of the characteristics, properties, structures, and performance of a variety of materials, from the level of the millimeter, to the micrometer, to the angstrom.

Equipment List

• AFM - Agilent 5500
• AFM - Bruker Dimension Icon
• AFM - JPK Nanowizard 
• Anton-Paar SAXSpoint 5.0 Small Angle X-ray Scattering System
• Carbon coater - Leica ACE600
• Contact Angle Tensiometer - First Ten Angstroms DCA-100
• Critical Point Dryer - Leica CPD300
• Cryo Ultramicrotome  Leica EM UC7/FC7
• Cryostat- Leica CM1950
• Diamond Saw - South Bay 650
• DSC - Setaram SENSYS EVO
• DSC - TA Instruments Q2000
• Dual Beam Scanning Electron Microscope - ThermoFischer Scios
• Elemental Analyzer - Elementa-Vario Micro Cube
• Epredia Cryostat NX70 Cryostat
• Fluid Dispenser - Allied High Tech Products AD-5
• Freeze Substitution system - Leica AFS2
• High Pressure Freezer - Leica ICE
• High Purity Germanium detection system 
• Metallographic Microscope - Olympus SC50
• Microcalorimeter - TA Instruments TAM IV
• Microscope - Nikon LV 100 POL
• Mounting Press - Allied High Tech Products TechPress 3
• Nano Indenter - Agilent G200
• Nanoindenter - KLA Nanoflip
• Particle Sizing System - Anton Parr PSA 1190
• Petrology Saw/Grinder - Bueller Petrothin
• Plasma Cleaner - Solarus/Gatan Solarus
• Plasma Processor- Femto Science Cute
• Polishing station - Allied High Tech Products Dual Prep 3
• Potentiostat/Galvanostat- BioLogic Sp-300
• Poseidon Select Liquid Cell Holder 
• Protochips Atmosphere- TEM Environmental Gas Cell 
• Pycnometer - Micromeritics Accupyc 1340
• Raman Microscope - Witec Alpha 300
• Rotary Microtome (100 microns sections) - Leica RM2265
• Scanning Electron Microscope - ThermoFischer Quanta3D
• Single Crystal X-ray Diffraction System - Bruker D8
• Surface Characterization- Micromeritics 3Flex
• Surface Characterization-Degas Station
• Surface Tensometer - Biolin Sigma 701
• Target sample Preparation Device - Leica EM-TXP
• Tensile stage - MTI Instuments MTEST
• Thermal Analysis F1 209 Libra
• Thermal Analysis-TGA - TA Instruments Q600
• Thermal Conductivity Analyzer - C-Therm TCI
• Transmission Electron Microscope - ThermoFischer Talos F200X
• Vacuum Evaporator - Denton DV-502B
• Vapor Adsorption Analyzer
• Video Based Optical Contact Angle - DataPhysics OCA 15EC
• Vitrobot FEI Mark IV
• X-ray Powder Diffraction - Malvern Panalytical Empyrean 3 (New PXRD)
• X-ray Powder Diffraction (Reflection Mode) Empyrean 2
• XRF - Rigaku NEC GC