Analytical and Materials Characterization

The Analytical and Materials Characterization Core Technology Platform aids in the investigation of the characteristics, properties, structures, and performance of a variety of materials, from the level of the millimeter, to the micrometer, to the angstrom.

Equipment List

  • 3Flex Surface Analyzer
  • AccuPyc 11 1340 gas Pycnometer
  • Atomic Force Microscope
  • CHNS/O Analyzer
  • Confocal Raman AFM SNOM Combined System
  • DCA-100 Contact Angle Tensiometer
  • Dektek XT-A Surface Profiler
  • Denton Vacuum Evaporator DV-502B
  • Differential Scanning Calorimeter (DSCQ2000)
  • Dionek Accelerated solvent extractor
  • FEI Talos F200X Transmission Electron Microscope TEM
  • FEI Scios Dual Beam Focused Ion Beam FIB
  • Instron 5kN Universal Testing System
  • Leica Cryostat CM1950
  • Leica EM Critical Point Dryer
  • Nano-Flip SEM -Based Nanoindenter
  • Nano Indenter
  • Nikon LV 100 POL
  • Powder Xray Diffractometer
  • Scanning Electron Microscope
  • Simultaneous Thermal Analyzer (STA 6000)
  • Simultaneous Thermal Analyzer (STA Q600)
  • Single Crystal X-ray Diffraction System
  • South Bay Low Speed Saw
  • Video Based Optical Contact Angle
  • X-ray Powder Diffraction