Analytical and Materials Characterization

The Analytical and Materials Characterization Core Technology Platform supports scientific advancements and the development of new technologies. This facility provides state-of-the-art instrumentation with major capabilities for fundamental studies of the surface, ultrastructure, and interfacial properties of materials in the following major areas:

Materials Characterization

Characterization is used by researchers in the fields of chemistry, physics, biology, engineering, and archeology to study the properties of samples by morphology, mechanical, chemical and crystalline properties from macro to nanometer scale. The main techniques used in this area are optical microscopy, scanning electron microscopy, transmission electron microscopy, energy-dispersive x-ray spectroscopy, x-ray fluorescence, atomic force microscopy, and mechanical testing.

Electron Microscopy

Scanning Electron Microscopy is a key technique within the Materials Characterization realm. By utilizing focused electron beams, SEM produces high-resolution images of material surfaces. Researchers from diverse fields such as chemistry, physics, biology, engineering, and archeology leverage SEM to delve into the intricacies of sample morphology.

Transmission Electron Microscopy takes electron microscopy to the nanoscale, providing unparalleled insights into the ultrastructure of materials. This technique is employed across various disciplines, allowing researchers to explore the crystalline, mechanical, and chemical properties of samples with remarkable precision. TEM facilitates fundamental studies at the nanometer scale, contributing to advancements in fields such as materials science, chemistry, and biology.

NYUAD's Core Technology Platforms, Analytical and Materials Characterization (Electron Microscopy).

Crystallographic Characterization

Powder, single crystal, and Small Angle Scattering (SAXS) x-ray diffractometers are available for a wide range of material identification, structural characterization, and characterization of thin films. Various sample stages are available for ambient and non-ambient characterization

Recent research activities have included work on the structure of insect eyes, identification of diatoms on coral substrates, characterization of archaeological debris, cross-sectional imaging of integrated circuits, mechanical properties of organic crystals, X-ray tomography of organic crystals, analysis of lithographically defined materials, the structure of nano-scale scaffolds and Raman identification of olive oil adulterants, characterization of 2-D materials, and investigations of cements. Its ability to capture surface details with exceptional clarity makes it an indispensable tool for studying a wide range of materials, from biological specimens to engineered structures.