The Analytical and Materials Characterization Core Technology Platform aids in the investigation of the characteristics, properties, structures, and performance of a variety of materials, from the level of the millimeter, to the micrometer, to the angstrom.
Equipment List
- 3Flex Surface Analyzer
- AccuPyc 11 1340 gas Pycnometer
- Atomic Force Microscope
- CHNS/O Analyzer
- Confocal Raman AFM SNOM Combined System
- DCA-100 Contact Angle Tensiometer
- Dektek XT-A Surface Profiler
- Denton Vacuum Evaporator DV-502B
- Differential Scanning Calorimeter (DSCQ2000)
- Dionek Accelerated solvent extractor
- FEI Talos F200X Transmission Electron Microscope TEM
- FEI Scios Dual Beam Focused Ion Beam FIB
- Instron 5kN Universal Testing System
- Leica Cryostat CM1950
- Leica EM Critical Point Dryer
- Nano-Flip SEM -Based Nanoindenter
- Nano Indenter
- Nikon LV 100 POL
- Powder Xray Diffractometer
- Scanning Electron Microscope
- Simultaneous Thermal Analyzer (STA 6000)
- Simultaneous Thermal Analyzer (STA Q600)
- Single Crystal X-ray Diffraction System
- South Bay Low Speed Saw
- Video Based Optical Contact Angle
- X-ray Powder Diffraction
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