Analytical and Materials Characterization

The Analytical and Materials Characterization Core Technology Platform aids in the investigation of the characteristics, properties, structures, and performance of a variety of materials, from the level of the millimeter, to the micrometer, to the angstrom.

Equipment List

  • AFM - Agilent 5500
  • AFM - Bruker Dimension Icon
  • Carbon coater - Leica ACE600
  • Contact Angle Tensiometer - First Ten Angstroms DCA-100
  • Critical Point Dryer - Leica CPD300
  • Cryo Ultramicrotome  Leica EM UC7/FC7
  • Cryostat- Leica CM1950
  • Diamond Saw - South Bay 650
  • DSC - Setaram SENSYS EVO
  • DSC - TA Instruments Q2000
  • Dual Beam Scanning Electron Microscope - ThermoFischer Scios
  • Elemental Analyzer - Elementa-Vario Micro Cube
  • Fluid Dispenser - Allied High Tech Products AD-5
  • Freeze Substitution system - Leica AFS2
  • High Pressure Freezer - Leica ICE
  • High Purity Germanium detection system 
  • Metallographic Microscope - Olympus SC50
  • Microcalorimeter - TA Instruments TAM IV
  • Microscope - Nikon LV 100 POL
  • Mounting Press - Allied High Tech Products TechPress 3
  • Nano Indenter - Agilent G200
  • Nanoindenter - KLA Nanoflip
  • Particle Sizing System - Anton Parr PSA 1190
  • Petrology Saw/Grinder - Bueller Petrothin
  • Plasma Cleaner - Solarus/Gatan Solarus
  • Plasma Processor- Femto Science Cute
  • Polishing station - Allied High Tech Products Dual Prep 3
  • Potentiostat/Galvanostat- BioLogic Sp-300
  • Pycnometer - Micromeritics Accupyc 1340
  • Raman Microscope - Witec Alpha 300
  • Rotary Microtome (100 microns sections) - Leica RM2265
  • Scanning Electron Microscope - ThermoFischer Quanta3D
  • Single Crystal X-ray Diffraction System - Bruker D8
  • Surface Characterization- Micromeritics 3Flex
  • Surface Characterization-Degas Station
  • Surface Tensometer - Biolin Sigma 701
  • Target sample Preparation Device - Leica EM-TXP
  • Tensile stage - MTI Instuments MTEST
  • Thermal Analysis F1 209 Libra
  • Thermal Analysis-TGA - TA Instruments Q600
  • Thermal Conductivity Analyzer - C-Therm TCI
  • Transmission Electron Microscope - ThermoFischer Talos F200X
  • Vacuum Evaporator - Denton DV-502B
  • Vapor Adsorption Analyzer
  • Video Based Optical Contact Angle - DataPhysics OCA 15EC
  • Vitrobot FEI Mark IV
  • X-ray Powder Diffraction - Malvern Panalytical Empyrean 3 (New PXRD)
  • X-ray Powder Diffraction (Reflection Mode) Empyrean 2
  • XRF - Rigaku NEC GC