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Awards, Grants, and Patents

Patent

SISTEMA DE CONTROL DE CALIDAD DE MICROESTRUCTURAS MEDIANTE EL ANÁLISIS DE IMÁGENES UTILIZANDO COMPUTACIÓN DE ALTO RENDIMIENTO Y PARALELIZACIÓN” Clasificación IPC: G01J 3/00. Reivindicación(es): 1 a 6 incluidas en el radicado bajo el No NC2017/0007309 el 26 de diciembre de 2018. Titular(es): UNIVERSIDAD ANTONIO NARIÑO. Domicilio(s): Carrera 3 Este # 47A – 15, BOGOTÁ D.C., COLOMBIA. Inventor(es): RAFAEL MARÍA GUTIÉRREZ SALAMANCA y CÉSAR AUGUSTO RODRÍGUEZ SUÁREZ. Vigente desde: 21 de julio de 2017 Hasta: 21 de julio de 2037.

Awards and Honors

  • Senior Researcher recognized by the Colombian Institute for the Development of Science and Technology "Francisco José De Caldas" – COLCIENCIAS, 2013 to present.
  • Highest standard classification of R&D groups in Colombia, A1, granted by the Colombian Institute for the Development of Science and Technology "Francisco José De Caldas" – COLCIENCIAS, 2011 to present.
  • Senior researcher, Organization of American States, OAS, Inter-American Council for Integral Development, CIDI, Non-permanent Specialized Commitment to Scientific Development and Technology Transfer, AICD, Washington, USA, 2008-2009.
  • Best research project of international cooperation, MercoSur, Brazil, 2008. • COLCIENCIAS Ph.D. Scholarship from the Colombian Government, 1992. 
  • Quebec Government M.Sc. Scholarship, Montreal Canada, 1990. • Tuition exceptions and honor registration, B.Sc. Physics, Universidad Nacional de Colombia, Bogotá, 1985-1988.