Logic-locked chip

Digital Security Research Wins Notable Award

Muhammad Yasin, NYU Abu Dhabi Global PhD Fellow in engineering, has won the semi-final of the TTTC’s E.J. McCluskey Best Doctoral Thesis Award at the IEEE VLSI Test Symposium for engineers held in San Francisco.

Yasin was recognized for his work on groundbreaking hardware security research happening in the Design for Excellence Lab at NYUAD, led by cybersecurity expert Ozgur Sinanoglu.

Yasin’s winning thesis, Provably Secure Logic Locking for Hardening Hardware Security, went up against PhD student research from Georgia Tech, Duke, University of Texas at Dallas, and others.

He will take part in the final competition in October as the winner of North America against winners from Latin America, Europe, and Asia.

Named after Professor E.J. McCluskey, a key contributor to the field of test technology, the annual Best Doctoral Thesis Award promotes impactful doctoral student work.