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Awards, Grants, and Patents

  • [2019] M. Bakker, D. Piracha, P. Lu, K. Bejgo, M. Bahrami, Y. Leng, J. Balsa-Barreiro, J. Ricard, A. Morales, V. Singh, B. Bozkaya, S. Balcısoy and A.S. Pentland. Measuring fine-grained multidimensional integration using mobile phone metadata: the case of Syrian refugees in Turkey. Honorable Mention in the Data For Refugees (D4R) Challenge (category: Social Integration).
  • [2013] J. Balsa-Barreiro -supervised by J.L. Lerma, A. Rovira, and L. Duenas -. LIDAR: from cartographic to industrial engineering. Some applications of low-cost geoprocessing with LiDAR data. 2nd position in the 1st Ed. of the IDEAS StarUPV (category: Final Projects 2K13).
  • [2013] J. Balsa-Barreiro -supervised by J.L. Lerma, A. Rovira, and L. Duenas -. LIDAR: from cartographic to industrial engineering. Some applications of low-cost geoprocessing with LiDAR data. Quality Mention in the 4th Ed. of the ESRI Final Studies.
  • [2007] J. Balsa-Barreiro -supervised by R.C. Lois -. Analysis and implementation of a GIS for services management in any level of Public Administrations. Particularization and enhancing applications for the Directorate General of Tourism-Turgalicia (Counseling of Innovation and Industry of the Galician Government). Winner of the 16th Ed. of the Manuel Colmeiro Award organized by the Galician School of Public Administration (EGAP) (category: most relevant study on Public Administrations).
  • [2006] J. Balsa-Barreiro -supervised by J.L. Lerma-. LiDAR Technology (Light Detection and Ranging) and its application to the generation of digital urban models. Finalist of the 6th Ed. of the Jordi Viñas i Foch Award organized by the Cartographic Institute of Catalonia (category: most relevant study on mapping applications).
  • [2006] J. Balsa-Barreiro -supervised by J.L. Lerma-. LiDAR Technology (Light Detection and Ranging) and its application to the generation of digital urban models. Finalist of the 1st Ed. of the Padre Tosca Award organized by the Cartographic Institute of Valencia (category: most relevant study on mapping applications).