The Analytical and Materials Characterization CTP aids in the investigation of the characteristics, properties, structures, and performance of a variety of materials, from the level of the millimeter, to the micrometer, to the angstrom.

Equipment List:3 Flex Surface Analyzer

  • Atomic Force Microscope
  • CHNS/O Analyzer
  • Confocal Raman AFM SNOM Combined System
  • DCA-100 Contact Angle Tensiometer
  • Dektek XT-A Surface Profiler
  • Denton Vacuum Evaporator DV-502B
  • Differential Scanning Calorimeter (DSCQ2000)
  • Dionek Accelerated solvent extractor
  • FEI Talos F200X Transmission Electron Microscope TEM
  • FEI Scios Dual Beam Focused Ion Beam FIB
  • Instron 5kN Universal Testing System
  • Leica EM Critical Point Dryer
  • Nano Indenter
  • Nikon LV 100 POL
  • Scanning Electron Microscope
  • Simultaneous Thermal Analyzer (STA 6000)
  • Simultaneous Thermal Analyzer (STA Q600)
  • Single Crystal X-ray Diffraction System
  • South Bay Low Speed Saw
  • Video Based Optical Contact Angle
  • X-ray Powder Diffraction